Toma Susi (Physics of Nanostructured Materials) was interviewed for the recent feature “The microscope revolution that’s sweeping through materials science - Technological advances are transforming what researchers can study at the atomic scale” in the journal Nature. The work of Dr. Susi and his colleagues highlighted in the feature is based on the article “Electron-Beam Manipulation of Silicon Dopants in Graphene” which was published in Nano Letters in June 2018. The web version of the feature includes an animation by Dr. Susi showing how a silicon impurity is moved around inside a hexagonal graphene lattice using the focused electron beam of a scanning transmission electron microscope.
https://www.nature.com/articles/d41586-018-07448-0
