The group focuses on maximizing the information obtained about a sample with a finite number of photons or electrons. This is especially important in biological and electrochemical applications where the interaction between the probe particles and the specimen can modify or destroy the sample. Recent highlights include the development of a programmable electron beam shaper [1], which enables the adaptive optimization of electron microscopy for specific specimens, and the realization of a fast super-resolution lifetime imaging technique for live-cell microscopy [2]. Thomas Juffmann also coordinates the international 'Optical Near-field Electron Microscopy' [3], which aims to realize a hybrid imaging method that uses light to non-invasively probe a specimen, and electrons for high-resolution imaging.
[1] https://doi.org/10.1103/PhysRevX.12.031043
[2] https://arxiv.org/abs/2502.16672mihaila
[3] https://onem.eu/
